Warwick University to boost WBG chip reliability testing
The University of Warwick has secured major new funding to boost the UK’s ability to test the reliability of advanced semiconductors used in electric vehicles, renewable energy, and other critical technologies.
The funding will support the purchase of the Wide-Bandgap (WBG) Dynamic Reliability & Robustness Tester, a state-of-the-art testing system from UK-based manufacturer, ipTEST Ltd. The new system will enable researchers to put next-generation power semiconductor devices through extreme test conditions to see how they perform, and when they fail.
The system forms part of the £12 million REWIRE Innovation and Knowledge Centre (IKC), the UK’s national centre for wide-bandgap semiconductor reliability and represents a major addition to national capability.
The new equipment will be housed within Warwick’s Driving the Electric Revolution – Innovation Centre (DER-IC). It is expected to be fully operational by April 2026 and will be available to academic and industry users across the UK.
Peter Gammon, REWIRE IKC Lead at the University of Warwick, said: “This award is transformative for the University of Warwick and the REWIRE IKC. By enabling fast, repeatable, and industry aligned reliability testing, this equipment will allow us to build the UK’s first comprehensive SiC and GaN reliability database. It also provides a foundation for new commercial services that will support UK manufacturers, SMEs, and international device suppliers alike.”
Access to advanced reliability testing remains limited in the UK, particularly for smaller companies. The new facility at Warwick will help address this gap by providing high-quality, independent testing that businesses can trust.
